manoj sachdev
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
EbookSofort lieferbarAs technology scales into nano-meter region, design and test of Static Random Access Memories (SR...
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
EbookSofort lieferbarThe challenges associated with the design and implementation of Electrostatic Discharge (ESD) pro...
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
EbookSofort lieferbarFailures of nano-metric technologies owing to defects and shrinking process tolerances give rise ...
Thermal and Power Management of Integrated Circuits
EbookSofort lieferbarThermal modeling of high performance circuits and systems is a crucial component for thermal and ...
Defect Oriented Testing for CMOS Analog and Digital Circuits
EbookSofort lieferbarDefect oriented testing is expected to play a significant role in coming generations of technolog...
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
BuchBezug 11-15Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...
Esd Protection Device and Circuit Design for Advanced CMOS Technologies
BuchBezug 11-15ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended f...
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
TaschenbuchBezug 11-15Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
TaschenbuchBezug 11-15ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended f...
Thermal and Power Management of Integrated Circuits
TaschenbuchBezug 11-15In Thermal and Power Management of Integrated Circuits, power and thermal management issues in...
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
TaschenbuchBezug 11-15CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies cove...
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