josé pineda de gyvez
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
EbookSofort lieferbarFailures of nano-metric technologies owing to defects and shrinking process tolerances give rise ...
Low-Power High-Resolution Analog to Digital Converters
EbookSofort lieferbarWith the fast advancement of CMOS fabrication technology, more and more signal-processing functio...
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
EbookSofort lieferbarThe history of this book begins way back in 1982. At that time a research proposal was filed with...
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
BuchBezug 11-15Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
TaschenbuchBezug 11-15Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...
Low-Power High-Resolution Analog to Digital Converters
BuchBezug 11-15With the fast advancement of CMOS fabrication technology, more and more signal-processing func...
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
TaschenbuchBezug 11-15The history of this book begins way back in 1982. At that time a research proposal was filed with...
Low-Power High-Resolution Analog to Digital Converters
TaschenbuchBezug 11-15With the fast advancement of CMOS fabrication technology, more and more signal-processing func...
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