Conductive Atomic Force Microscopy
-11 %

Conductive Atomic Force Microscopy

Applications in Nanomaterials
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ISBN-13:
9783527340910
Einband:
Buch
Erscheinungsdatum:
11.10.2017
Seiten:
362
Autor:
Mario Lanza
Gewicht:
979 g
Format:
251x177x27 mm
Sprache:
Englisch
Beschreibung:
Foreword
Preface
Introduction to CAFM: History, Experimental and Current Status
Reliability of Polycrystalline Thin Oxides and Insulators
Investigation of High-k Dielectric Stacks by TUNA and CAFM: Advantages, Limitations and Applications
3D Tomography for Analyzing Conductive Filaments for Resistive Random Access Memory Devices
CAFM Applications for Energy Efficient and High-Frequency Electronics
Local Anodic Oxidation with AFM Tips
CAFM Studies of Low-Dimensional Materials
Design of a Logarithmic Amplifier for CAFM
Resiscopes for Analyzing Wide Dynamic Current Ranges
Combination of CAFM with the Probestation for Characterization of Resistive Switching and Channel Hot Carriers Degradation in FETs
Multiprobe CAFM
Scanning Capacitance Microscopy as a Complementary Tool for CAFM
KPFM and its Use to Characterize the CPD in Different Materials
Hot-Electron Nanoscopy Using Adiabatic Compression of Surface Plasmons
Fabrication and Reliability of AFM Nanoprobes
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM.With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.

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