This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.
- Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;
- Presents practical algorithms for design and implementation of efficient multi-run tests;
- Demonstrates methods verified by analytical and experimental investigations.
Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process
Introduction to digital memory.- Basics of functional RAM testing.- Multi-cell faults.- Controlled random testing.- Multi-run tests based on background changing.- Multi-run tests based on address changing.- Multiple controlled random testing.- Pseudo exhaustive testing based on march tests.- Conclusion.