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Dopants and Defects in Semiconductors

61,49 €*

ISBN-13:
9781351977982
Veröffentl:
2018
Seiten:
372
Autor:
Matthew D. McCluskey
eBook Typ:
PDF
eBook Format:
EPUB
Kopierschutz:
2 - DRM Adobe
Sprache:
Englisch
Beschreibung:
This revised edition continues to provide the most complete coverage of the fundamental knowledge of semiconductors. In addition to inclusion of new chapter problems and worked examples, it delves into solid-state lighting (LEDs and laser diodes), and offers a solid foundation for experimental methods and the theory of defects in semiconductors.
Praise for the First Edition"e;The book goes beyond the usual textbook in that it provides more specific examples of real-world defect physics an easy reading, broad introductory overview of the field"e; Materials Today"e; well written, with clear, lucid explanations "e;Chemistry WorldThis revised edition provides the most complete, up-to-date coverage of the fundamental knowledge of semiconductors, including a new chapter that expands on the latest technology and applications of semiconductors. In addition to inclusion of additional chapter problems and worked examples, it provides more detail on solid-state lighting (LEDs and laser diodes). The authors have achieved a unified overview of dopants and defects, offering a solid foundation for experimental methods and the theory of defects in semiconductors.Matthew D. McCluskey is a professor in the Department of Physics and Astronomy and Materials Science Program at Washington State University (WSU), Pullman, Washington. He received a Physics Ph.D. from the University of California (UC), Berkeley.Eugene E. Haller is a professor emeritus at the University of California, Berkeley, and a member of the National Academy of Engineering. He received a Ph.D. in Solid State and Applied Physics from the University of Basel, Switzerland.
1. Semiconductor Basics 2. Defect Classifications 3. Interfaces and Devices 4. Crystal Growth and Doping 5. Electronic Properties 6. Vibrational Properties 7. Optical Properties 8. Thermal Properties 9. Electrical Measurements 10. Optical Spectroscopy 11. Particle-Beam Methods 12. Microscopy and Structural Characterization

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