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Full-Wave Based Validation of Stripline Field Applicator for Low Frequency Material Measurements
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Full-Wave Based Validation of Stripline Field Applicator for Low Frequency Material Measurements

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ISBN-13:
9781288331888
Einband:
Paperback
Seiten:
102
Autor:
James H. Crane
Gewicht:
195 g
Format:
246x189x6 mm
Sprache:
Englisch
Beschreibung:

This research presents the analysis and veri cation of a stripline designed by Air Force Research Laboratory for use in measuring the electrical properties of materials at low frequencies and high temperature. It is designed to operate in the TEM mode up to 4 Ghz and have a characteristic impedance of 50 ohms. A full wave base method is used to analyze the structure. A pair of coupled electric eld integral equations (CIE) are formulated using The parallel plate waveguide dyadic Green's function. These CIEs are solved through a computationally e cient entire-domain method of moments (MoM) technique. Numerical e ciency are gained through employing Chebsyshev polynomials of the rst and second kind as testing and expansion functions. Further numerical e ciencies are gained by taking advantage of transverse electromagnetic propagation properties to develop a specialized TEM integral equation. An expression for the characteristic impedance is developed using the MoM results. The characteristic impedance is calculated for various degrees of center conductor miss alignment.