Surface Science Tools for Nanomaterials Characterization

Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

Higher Resolution Scanning Probe Methods for Magnetic Imaging.- The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials.- SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography.- Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy.- Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM).- Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy.- Magnetic Force Microscopy.- High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films.- FIM-Characterized Tips for SPM.- Scanning Conductive Torsion Mode Microscopy.- Scanning Probe Acceleration Microscopy (SPAM).- Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures.- Field Ion Microscopy (FIM).- Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.